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Uniform and Sampled Bragg Gratings in SOI Strip Waveguides with Sidewall Corrugations

Publication Type:

Journal Article

Source:

IEEE Photonics Technology Letters, Volume 23, Issue 5, p.290 - 292 (2011)

URL:

http://dx.doi.org/10.1109/LPT.2010.2103305

Keywords:

Bragg gratings; sampled gratings; silicon-on-insulator; strip waveguides

Abstract:

We have demonstrated uniform and sampled Bragg gratings in silicon-on-insulator strip waveguides with symmetric sidewall corrugations. The fabrication is based on 193-nm deep ultraviolet lithography using a single mask. The measured reflection spectra of sampled gratings exhibit ten usable peaks spaced by 4.2 nm, and show good agreement with theoretical predictions.

Full Text:

http://www.mina.ubc.ca/files/PTL_final.pdf

Faculty Member(s): 
Lukas.Chrostowski
Faculty Member(s): 
Nicolas.Jaeger
Research Area(s): 
Photonics and Optics