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A fuzzy multiple signature compaction scheme for BIST

Publication Type:

Conference Paper

Source:

Proceedings. First Asian Test Symposium (ATS '92) (Cat. No.TH0458-0), IEEE Comput. Soc. Press, Hiroshima, Japan, p.247-52 (1992)

URL:

http://dx.doi.org/10.1109/ATS.1992.224400

Keywords:

built-in self test; fault location; fuzzy logic; logic testing; signal processing

Abstract:

Compared to single signature analysis, checking multiple signatures yields smaller aliasing, easier fault coverage computation, shorter average test-time, and increased fault diagnosability. In conventional multiple signature (CMS) schemes, for a CUT to be declared good, at each check point, the signature obtained must match a specific reference. This strict one-to-one correspondence makes the CMS scheme complex to implement and expensive in terms of silicon area. The authors propose a fuzzy multiple signature compaction scheme in which the requirement for the one-to-one correspondence is removed. In the FMS scheme, for a CUT to be declared good, it suffices that the signature obtained at each check point correspond to any of a set of references