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A current integrator for BIST of mixed-signal ICs

Publication Type:

Conference Paper

Source:

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146), IEEE Comput. Soc, Dana Point, CA, USA, p.311-18 (1999)

URL:

http://dx.doi.org/10.1109/VTEST.1999.766681

Keywords:

built-in self test; circuit optimisation; CMOS integrated circuits; integrating circuits; mixed analogue-digital integrated circuits

Abstract:

A novel built-in current integrator (BICI) is proposed for measuring the average supply current (IDD) of embedded circuit blocks. Such a circuit can be used both as a current signature generator and power monitor. The BICI uses only small capacitors (total 72 pF), a simple comparator, 7 switches, and a counter to perform integration over a long time (1 ms) window and digitize IDD. The BICI generates a digital signature proportional to IDD and occupies a small area which make it suitable for BIST applications on mixed-signal ICs. The circuit has been implemented using a standard 0.5 ? CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided. Simulation results are also included