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CMOS differential and absolute thermal sensors

Publication Type:

Journal Article

Source:

J. Electron. Test., Theory Appl. (Netherlands), Volume 18, p.295-304 (2002)

URL:

http://dx.doi.org/10.1023/A:1015035222259

Keywords:

CMOS digital integrated circuits; integrated circuit testing; silicon; temperature distribution; temperature sensors

Abstract:

This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors have been implemented in a standard 0.18 ?m CMOS technology