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Catastrophic short and open fault detection in bipolar CML circuits: a case study

Publication Type:

Journal Article

Source:

J. Electron. Test., Theory Appl. (Netherlands), Volume 16, p.631-4 (2000)

URL:

http://dx.doi.org/10.1023/A:1008325420970

Keywords:

bipolar logic circuits; current-mode logic; fault location; integrated circuit testing; logic testing

Abstract:

The detection of catastrophic short and open faults in bipolar current mode logic (CML) circuits is studied. The non-intrusive tests considered include functional (logic) tests, an Idd test, and a common-mode test. A 622 Mbps SONET SIPO (Serial-In/Parallel-Out) and a PISO (Parallel-In/Serial-Out) circuit form the basis of this case study