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A built-in current sensor for testing analog circuit blocks

Publication Type:

Conference Paper

Source:

IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309), IEEE, Volume vol.3, Venice, Italy, p.1403-8 (1999)

URL:

http://dx.doi.org/10.1109/IMTC.1999.776039

Keywords:

built-in self test; circuit optimisation; CMOS analogue integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing

Abstract:

A built-in current (BIC) sensor circuit is proposed for supply current (IDD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the IDD path. The circuit has been implemented using a standard 0.5 ?m CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included