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BIST for network-on-chip interconnect infrastructures

Publication Type:

Conference Paper

Source:

Proceedings. 24th IEEE VLSI Test Symposium, IEEE Computer Society, Berkeley, CA, USA, p.6 pp. (2006)

Keywords:

built-in self test; coupled circuits; crosstalk; network-on-chip; switched networks

Abstract:

In this paper, we present a novel built-in self-test methodology for testing the inter-switch links of network-on-chip (NoC) based chips. This methodology uses a high-level fault model that accounts for crosstalk effects due to inter-wire coupling. The novelty of our approach lies in the progressive reuse of the NoC infrastructure to transport test data to its own components under test in a bootstrap manner, and in extensively exploiting the inherent parallelism of the data transport mechanism to reduce the test time and implicitly the test cost