User login

Microscopy

Abstract

High-resolution imaging, in particular using electron microscopes, is an integral part of device research. For nanoscale structures, artefacts such as those arising from sample charging and contamination deposition can severely affect the imaging process.

Project Description

High-resolution imaging, in particular using electron microscopes, is an integral part of device research. However, for nanoscale structures, artefacts such as those arising from sample charging and contamination deposition can severely affect the imaging process. For the accurate interpretation of nanostructure images, it is important to study these effects systematically and find ways to minimize them or compensate for them. The understanding developed in this research helps us in the imaging/inspection of devices built for our other projects. Moreover, the interaction of electron beams with nanostructures is in itself an interesting subject to study. For example, carbon nanotubes provide a very small interaciton area with the primary beam of a scanning electron microscope. Yet, they are quite easily visible in the microscope, which is quite puzzling based on traditional beam-bulk interaction models. However, new mechanisms can be at play in secondary electron emission from nanotubes compared to bulk samples. Also, their visibility could largely depend on surface charging phenomena.

Faculty Supervisor(s)

    Alireza.Nojeh   

Researchers(s)

       

Research Area(s)