%0 Conference Paper %B Proceedings. Sixth Asian Test Symposium (ATS'97) (Cat. No.97TB100205) %D 1997 %T Power supply current monitoring techniques for testing PLLs %A Dalmia, M %A Ivanov, A %A Tabatabaei, S %C Akita, Japan %I IEEE Comput. Soc %K analogue integrated circuits,automatic testing,circuit analysis computing,electric current measurement,fault diagnosis,integrated circuit testing,mixed analogue-digital integrated circuits,Monte Carlo methods,phase locked loops %P 366-71 %U http://dx.doi.org/10.1109/ATS.1997.643984 %X The effectiveness of current testing for digital IC's has led researchers to explore the possibility of extending this concept to testing analog blocks of mixed-signal ICs. Unfortunately, test techniques developed for commonly-studied analog blocks such as op-amps and filters do not apply to non-linear blocks such as phase-locked loops. This paper focuses on investigating the effectiveness of using an operating power supply current monitoring technique to detect potential faults in a phase-locked loop (PLL) circuit %9 inproceedings