%0 Conference Paper %B Proceedings International Test Conference 2002 (Cat. No.02CH37382) %D 2002 %T Dedicated autonomous scan-based testing (DAST) for embedded cores %A Nahvi, M %A Ivanov, A %A Saleh, R %C Baltimore, MD, USA %I IEEE %K automatic test equipment,boundary scan testing,integrated circuit testing,logic testing,system-on-chip %P 1176-83 %U http://dx.doi.org/10.1109/TEST.2002.1041876 %X The complexity of today's chips is such that relying solely upon external ATE resources is insufficient for scan test. In this work, we develop the concept of dedicated autonomous scan-based testing (DAST) by proposing a scheme that introduces hierarchy and separates the functionality of ATE resources into two distinctive classes: a) test data communication, and b) test data control and observation. To simplify the ATE for embedded digital core testing, we propose transferring ATE test data control/observation functions to one or more Embedded Autonomous Sequencers (EAS) dedicated to single or multiple embedded cores of an SoC We present implementation results of our DAST methodology when applied to a number of SoC benchmarks %9 inproceedings