%0 Conference Paper %B 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.90CH2924-9) %D 1990 %T Computing the error escape probability in count-based compaction schemes %A Ivanov, A %A Zorian, Y %C Santa Clara, CA, USA %I IEEE Comput. Soc. Press %K circuit layout CAD,fault location %P 368-71 %U http://dx.doi.org/10.1109/ICCAD.1990.129927 %X A unified probabilistic model of count-based compaction is presented that relates the probability of occurrence of the `counted' events to a circuit's fault detection probabilities. This model enables an identical treatment to be made of all the different count-based techniques proposed to date, e.g., ones, transitions, edges, and spectral coefficients. Based on this model, the authors propose a computation technique for determining the error escape associated with these specific, as well as more general, count-based compaction techniques, under various error models %9 inproceedings