%0 Journal Article %J J. Electron. Test., Theory Appl. (Netherlands) %D 2002 %T CMOS differential and absolute thermal sensors %A Syal, A %A Lee, V %A Ivanov, A %A Altet, J %K CMOS digital integrated circuits,integrated circuit testing,silicon,temperature distribution,temperature sensors %P 295-304 %U http://dx.doi.org/10.1023/A:1015035222259 %V 18 %X This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors have been implemented in a standard 0.18 ?m CMOS technology %8 jun %9 article