%0 Conference Paper %B Proceedings. First Asian Test Symposium (ATS '92) (Cat. No.TH0458-0) %D 1992 %T A fuzzy multiple signature compaction scheme for BIST %A Wu, Yuejian %A Ivanov, A %C Hiroshima, Japan %I IEEE Comput. Soc. Press %K built-in self test,fault location,fuzzy logic,logic testing,signal processing %P 247-52 %U http://dx.doi.org/10.1109/ATS.1992.224400 %X Compared to single signature analysis, checking multiple signatures yields smaller aliasing, easier fault coverage computation, shorter average test-time, and increased fault diagnosability. In conventional multiple signature (CMS) schemes, for a CUT to be declared good, at each check point, the signature obtained must match a specific reference. This strict one-to-one correspondence makes the CMS scheme complex to implement and expensive in terms of silicon area. The authors propose a fuzzy multiple signature compaction scheme in which the requirement for the one-to-one correspondence is removed. In the FMS scheme, for a CUT to be declared good, it suffices that the signature obtained at each check point correspond to any of a set of references %9 inproceedings