%0 Conference Paper %B Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) %D 1999 %T A current integrator for BIST of mixed-signal ICs %A Tabatabaei, S %A Ivanov, A %C Dana Point, CA, USA %I IEEE Comput. Soc %K built-in self test,circuit optimisation,CMOS integrated circuits,integrating circuits,mixed analogue-digital integrated circuits %P 311-18 %U http://dx.doi.org/10.1109/VTEST.1999.766681 %X A novel built-in current integrator (BICI) is proposed for measuring the average supply current (IDD) of embedded circuit blocks. Such a circuit can be used both as a current signature generator and power monitor. The BICI uses only small capacitors (total 72 pF), a simple comparator, 7 switches, and a counter to perform integration over a long time (1 ms) window and digitize IDD. The BICI generates a digital signature proportional to IDD and occupies a small area which make it suitable for BIST applications on mixed-signal ICs. The circuit has been implemented using a standard 0.5 ? CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided. Simulation results are also included %9 inproceedings