%0 Conference Paper %B IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309) %D 1999 %T A built-in current sensor for testing analog circuit blocks %A Tabatabaei, S %A Ivanov, A %C Venice, Italy %I IEEE %K built-in self test,circuit optimisation,CMOS analogue integrated circuits,electric current measurement,electric sensing devices,integrated circuit testing %P 1403-8 %U http://dx.doi.org/10.1109/IMTC.1999.776039 %V vol.3 %X A built-in current (BIC) sensor circuit is proposed for supply current (IDD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the IDD path. The circuit has been implemented using a standard 0.5 ?m CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included %9 inproceedings