%0 Conference Paper %B ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349) %D 1999 %T A built-in current monitor for testing analog circuit blocks %A Tabatabaei, S %A Ivanov, A %C Orlando, FL, USA %I IEEE %K built-in self test,electric current measurement,integrated circuit testing,integrating circuits,mixed analogue-digital integrated circuits,monitoring %P 109-14 %U http://dx.doi.org/10.1109/ISCAS.1999.780631 %V vol.2 %X A novel built-in current (BIC) monitor circuit is proposed for supply current (IDD) measurement and testing of embedded analog circuits. The BIC monitor provides high current measurement sensitivity without introducing a large impedance in the IDD path. It also includes a current integrator circuit which generates a digital signature proportional to the average IDD (I?D?D?). The integrator uses only small capacitors (totaling 74 pF), 4 comparators, 14 switches and a counter to perform integration over a long time (1 ms) window and to digitize I? D?D?. The monitor occupies a small area and is suitable for BIST applications on mixed-signal ICs %9 inproceedings