%0 Journal Article %J APPLIED PHYSICS LETTERS %D 2011 %T Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor ?eld-effect transistors %A Chih-Hao Dai and Cheng Tung Huang, Ting-Chang Chang Ann-Kuo Chu Yuan-Jui Kuo Wen-Hung Lo Szu-Han Ho Ching-En Chen Jou-Miao Shih Hua-Mao Chen Bai-Shan Dai Guangrui Xia Osbert Cheng %V 98 %8 03/2011