%0 Journal Article %J 12th Conference on Design of Circuits and Integrated Circuits %D 2007 %T A test mechanism for device diagnostics and process characterisation %A Rocha, Luis %A Mol, Lukas %A Cretu, Edmond %A Wolffenbuttel, Reinoud %C Sevilla, Spain %P 597-602 %8 21-23/Nov/2007 %9 inproceedings %@ 978 84690 8629 2