@inproceedings { dalmia_power_199, title = {Power supply current monitoring techniques for testing PLLs}, journal = {Proceedings. Sixth Asian Test Symposium (ATS'97) (Cat. No.97TB100205)}, year = {1997}, pages = {366-71}, publisher = {IEEE Comput. Soc}, organization = {IEEE Comput. Soc}, type = {inproceedings}, address = {Akita, Japan}, abstract = {The effectiveness of current testing for digital IC's has led researchers to explore the possibility of extending this concept to testing analog blocks of mixed-signal ICs. Unfortunately, test techniques developed for commonly-studied analog blocks such as op-amps and filters do not apply to non-linear blocks such as phase-locked loops. This paper focuses on investigating the effectiveness of using an operating power supply current monitoring technique to detect potential faults in a phase-locked loop (PLL) circuit}, keywords = {analogue integrated circuits,automatic testing,circuit analysis computing,electric current measurement,fault diagnosis,integrated circuit testing,mixed analogue-digital integrated circuits,Monte Carlo methods,phase locked loops}, URL = {http://dx.doi.org/10.1109/ATS.1997.643984}, author = { Dalmia, M. and Ivanov, A. and Tabatabaei, S.} }