@article { ivanov_count-bas, title = {Count-based BIST compaction schemes and aliasing probability computation}, journal = {IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. (USA)}, volume = {11}, year = {1992}, month = {jun}, pages = {768-77}, type = {article}, abstract = {The authors present a unified probabilistic model of count-based compaction that relates the probability of occurrence of the counted events to a circuit's fault detection probabilities. This model allows an identical treatment of all the different count-based techniques proposed to date, e.g. ones, transitions, edges, and spectral coefficients, by essentially reducing all techniques to simple ones-counting. From a Markov model of ones-counting, the authors derive asymptotic aliasing probabilities, and for finite test sequence lengths they developed a computation technique for determining the aliasing associated with the specifically mentioned schemes, as well as more general count-based compaction techniques, under various error models}, keywords = {built-in self test,Markov processes,probability}, URL = {http://dx.doi.org/10.1109/43.137522}, author = { Ivanov, A. and Zorian, Y.} }