@inproceedings { ivanov_computing, title = {Computing the error escape probability in count-based compaction schemes}, journal = {1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.90CH2924-9)}, year = {1990}, pages = {368-71}, publisher = {IEEE Comput. Soc. Press}, organization = {IEEE Comput. Soc. Press}, type = {inproceedings}, address = {Santa Clara, CA, USA}, abstract = {A unified probabilistic model of count-based compaction is presented that relates the probability of occurrence of the `counted' events to a circuit's fault detection probabilities. This model enables an identical treatment to be made of all the different count-based techniques proposed to date, e.g., ones, transitions, edges, and spectral coefficients. Based on this model, the authors propose a computation technique for determining the error escape associated with these specific, as well as more general, count-based compaction techniques, under various error models}, keywords = {circuit layout CAD,fault location}, URL = {http://dx.doi.org/10.1109/ICCAD.1990.129927}, author = { Ivanov, A. and Zorian, Y.} }