@article { syal_cmos_2002, title = {CMOS differential and absolute thermal sensors}, journal = {J. Electron. Test., Theory Appl. (Netherlands)}, volume = {18}, year = {2002}, month = {jun}, pages = {295-304}, type = {article}, abstract = {This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors have been implemented in a standard 0.18 ?m CMOS technology}, keywords = {CMOS digital integrated circuits,integrated circuit testing,silicon,temperature distribution,temperature sensors}, URL = {http://dx.doi.org/10.1023/A:1015035222259}, author = { Syal, A. and Lee, V. and Ivanov, A. and Altet, J.} }