@inproceedings { grecu_bist_2006, title = {BIST for network-on-chip interconnect infrastructures}, journal = {Proceedings. 24th IEEE VLSI Test Symposium}, year = {2006}, pages = {6 pp.}, publisher = {IEEE Computer Society}, organization = {IEEE Computer Society}, type = {inproceedings}, address = {Berkeley, CA, USA}, abstract = {In this paper, we present a novel built-in self-test methodology for testing the inter-switch links of network-on-chip (NoC) based chips. This methodology uses a high-level fault model that accounts for crosstalk effects due to inter-wire coupling. The novelty of our approach lies in the progressive reuse of the NoC infrastructure to transport test data to its own components under test in a bootstrap manner, and in extensively exploiting the inherent parallelism of the data transport mechanism to reduce the test time and implicitly the test cost}, keywords = {built-in self test,coupled circuits,crosstalk,network-on-chip,switched networks}, author = { Grecu, C. and Pande, P. and Ivanov, A. and Saleh, R.} }