@inproceedings { tabatabaei_built, title = {A built-in current sensor for testing analog circuit blocks}, journal = {IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309)}, volume = {vol.3}, year = {1999}, pages = {1403-8}, publisher = {IEEE}, organization = {IEEE}, type = {inproceedings}, address = {Venice, Italy}, abstract = {A built-in current (BIC) sensor circuit is proposed for supply current (IDD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the IDD path. The circuit has been implemented using a standard 0.5 ?m CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included}, keywords = {built-in self test,circuit optimisation,CMOS analogue integrated circuits,electric current measurement,electric sensing devices,integrated circuit testing}, URL = {http://dx.doi.org/10.1109/IMTC.1999.776039}, author = { Tabatabaei, S. and Ivanov, A.} }