@inproceedings { tabatabaei_built, title = {A built-in current monitor for testing analog circuit blocks}, journal = {ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349)}, volume = {vol.2}, year = {1999}, pages = {109-14}, publisher = {IEEE}, organization = {IEEE}, type = {inproceedings}, address = {Orlando, FL, USA}, abstract = {A novel built-in current (BIC) monitor circuit is proposed for supply current (IDD) measurement and testing of embedded analog circuits. The BIC monitor provides high current measurement sensitivity without introducing a large impedance in the IDD path. It also includes a current integrator circuit which generates a digital signature proportional to the average IDD (I?D?D?). The integrator uses only small capacitors (totaling 74 pF), 4 comparators, 14 switches and a counter to perform integration over a long time (1 ms) window and to digitize I? D?D?. The monitor occupies a small area and is suitable for BIST applications on mixed-signal ICs}, keywords = {built-in self test,electric current measurement,integrated circuit testing,integrating circuits,mixed analogue-digital integrated circuits,monitoring}, URL = {http://dx.doi.org/10.1109/ISCAS.1999.780631}, author = { Tabatabaei, S. and Ivanov, A.} }