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Wang, Baosheng, Wu, Yuejian, Yang, Josh, Ivanov, A., Zorian, Y., "SRAM retention testing: zero incremental time integration with March algorithms", Proceedings. 23rd IEEE VLSI Test Symposium, Palm Springs, CA, USA, IEEE Comput. Soc, pp. 66-71, 2005  . Abstract Tagged XML BibTex
Wang, Baosheng, Yang, J., Cicalo, J., Ivanov, A., Zorian, Y., "Reducing embedded SRAM test time under redundancy constraints", Proceedings. 22nd IEEE VLSI Test Symposium, Napa Valley, CA, USA, IEEE Comput. Soc, pp. 237-42, 2004  . Abstract Tagged XML BibTex
Ivanov, A., Tsuji, B.K., Zorian, Y., "Programmable BIST space compactors", IEEE Trans. Comput. (USA), vol. 45, pp. 1393-404, dec. Abstract Tagged XML BibTex
Ivanov, A., Zorian, Y., "Count-based BIST compaction schemes and aliasing probability computation", IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. (USA), vol. 11, pp. 768-77, jun. Abstract Tagged XML BibTex
Ivanov, A., Zorian, Y., "Computing the error escape probability in count-based compaction schemes", 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.90CH2924-9), Santa Clara, CA, USA, IEEE Comput. Soc. Press, pp. 368-71, 1990  . Abstract Tagged XML BibTex