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Ye Zhu, Jiye Zhang, Hong Yu Li, Chuan Seng Tan and Guangrui (Maggie) Xia, "Study of Near-surface Stresses in Silicon around Through Silicon Vias at Elevated Temperatures by Raman spectroscopy and Simulations", IEEE Transactions on Device and Material Reliability, vol. 15, pp. 142-148, 06/2015. Abstract Tagged XML BibTex
Yang, B, Takalkar, R., Ren, Z., Black, L., Dube, A., Weijtmans, J.W., Li, J., Johnson, J.B., Faltermeier, J., Madan, A., Zhu, Z., Turansky, A., Xia, G., Chakravarti, A., Pal, R., Chan, K., Reznicek, A., Adam, T.N., de Sou, "High-performance nMOSFET with in-situ phosphorus-doped embedded Si:C (ISPD eSi:C) source-drain stressor", IEEE International Electron Device Meeting, 12/2008. Tagged XML BibTex
Z. Ren, G. Pei, J. Li, F. Yang, R. Takalkar, K. Chan, G. Xia, Z. Zhu, A. Madan, T. Pinto, T.Adam, J. Miller, A. Dube, L. Black, J. W. Weijtmans, B. Yang, E. Harley, A. Chakravarti, T.Kanarsky, I. Lauer, D.-G. Park, D. Sadana, and G. Shahidi, "PDSOI nMOSFETs with Embedded Phosphorus-doped SiC Stressors for CMOS Technology", IEEE Symp. on VLSI Tech. 2008, 07/2008. Tagged XML BibTex
S. Sambandan, L. Zhu, D. Striakhilev, P. Servati, A. Nathan, "Markov model for threshold-voltage shift in amorphous silicon TFTs for variable gate bias", IEEE ELECTRON DEVICE LETTERS, vol. 26, issue 6, pp. 375-377, 2005  . Tagged XML BibTex