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2006
Farahmand, T., Tabatabaei, S., Ben-Zeev, F., IvanoV, A., "A DDJ calibration methodology for high-speed test and measurement equipments", 2005 IEEE International Test Conference (IEEE Cat. No.05CH37661C), Austin, TX, USA, IEEE, pp. 10 pp., 2006  . Abstract Tagged XML BibTex
2005
Kuo, A., Rosales, R., Farahmand, T., Tabatabaei, S., Ivanov, A., "Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects", IEEE Trans. Instrum. Meas. (USA), vol. 54, pp. 1800-10, oct. Abstract Tagged XML BibTex
Wang, Baosheng, Kuo, A., Farahmand, T., Ivanov, A., Cho, Y.B., Tabatabaei, S., "A realistic timing test model and its applications in high-speed interconnect devices", J. Electron. Test., Theory Appl. (Netherlands), vol. 21, pp. 621-30, dec. Abstract Tagged XML BibTex
2004
Ou, N., Farahmand, T., Kuo, A., Tabatabaei, S., Ivanov, A., "Jitter models for the design and test of Gbps-speed serial interconnects", IEEE Des. Test Comput. (USA), vol. 21, pp. 302-13, jul. Abstract Tagged XML BibTex
Kuo, A., Farahmand, T., Ou, N., Tabatabaei, S., Ivanov, A., "Jitter models and measurement methods for high-speed serial interconnects", Proceedings. International Test Conference 2004 (IEEE Cat. No.04CH37586), Charlotte, NC, USA, IEEE, pp. 1295-302, 2004  . Abstract Tagged XML BibTex
2003
Wang, Baosheng, Cho, Y.B., Tabatabaei, S., Ivanov, A., "Yield, overall test environment timing accuracy, and defect level trade-offs for high-speed interconnect device testing", Proceedings of the Twelfth Asian Symposium, ATS 2003, Xi'an, China, IEEE Comput. Soc, pp. 348-53, 2003  . Abstract Tagged XML BibTex
1999
Tabatabaei, S., Ivanov, A., "A built-in current monitor for testing analog circuit blocks", ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349), vol. vol.2, Orlando, FL, USA, IEEE, pp. 109-14, 1999  . Abstract Tagged XML BibTex
Tabatabaei, S., Ivanov, A., "A built-in current sensor for testing analog circuit blocks", IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309), vol. vol.3, Venice, Italy, IEEE, pp. 1403-8, 1999  . Abstract Tagged XML BibTex
Tabatabaei, S., Ivanov, A., "A current integrator for BIST of mixed-signal ICs", Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146), Dana Point, CA, USA, IEEE Comput. Soc, pp. 311-18, 1999  . Abstract Tagged XML BibTex
1998
Rafiq, S., Ivanov, A., Tabatabaei, S., Renovell, M., "Testing for floating gates defects in CMOS circuits", Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259), Singapore, IEEE Comput. Soc, pp. 228-36, 1998  . Abstract Tagged XML BibTex
1997
Dalmia, M., Ivanov, A., Tabatabaei, S., "Power supply current monitoring techniques for testing PLLs", Proceedings. Sixth Asian Test Symposium (ATS'97) (Cat. No.97TB100205), Akita, Japan, IEEE Comput. Soc, pp. 366-71, 1997  . Abstract Tagged XML BibTex