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2011
Chih-Hao Dai,Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Szu-Han Ho, Tien-Yu Hsieh, Wen-Hung Lo, Ching-En Chen, Jou-Miao Shih, Wan-Lin Chung, Bai-Shan Dai, Hua-Mao Chen, Guangrui Xia, Osbert Cheng, and Cheng Tung Huang, "Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors", APPLIED PHYSICS LETTERS, vol. 99, pp. 012106, 07/2011. Tagged XML BibTex
Chih-Hao Dai, Ting-Chang Chang, An-Kuo Chu, Yuan-Jui Kuo, Fu-Yen Jian, Wen-Hung Lo, Szu-Han Ho, Ching-En Chen, Wan-Lin Chung, Jou-Miao Shih, Guangrui Xia, Osbert Cheng, and Cheng-Tung Huang, "On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs", IEEE Electron Device Letters, 07/2011. Tagged XML BibTex
Chih-Hao Dai,Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Wen-Hung Lo, Szu-Han Ho, Ching-En Chen, Jou-Miao Shih, Hua-Mao Chen, Bai-Shan Dai, Guangrui Xia, Osbert Cheng, and Cheng Tung Huang, "Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors", APPLIED PHYSICS LETTERS, vol. 98, 03/2011. Tagged XML BibTex
2010
Chih-Hao Dai, Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Shih-Ching Chen, Chih-Tsung Tsai, Wen-Hung Lo, Szu-Han Ho, Guangrui Xia, Osbert Cheng, Cheng Tung Huang, "Enhanced gate-induced foating-body effect in PD SOI MOSFET under external mechanical strain", Surface & Coatings Technology, vol. 205, 06/2010. Tagged XML BibTex
Chih-Hao Dai, Ting-Chang Chang, Ann-Kuo Chu, Yuan-Jui Kuo, Shih-Ching Chen, Chih-Chung Tsai, Szu-Han Ho, Wen-Hung Lo, Guangrui Xia, Cheng, Osbert Cheng and Cheng Tung Huang, "On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs", IEEE Electron Device Letters, 06/2010. Tagged XML BibTex
2005
Kuo, A., Rosales, R., Farahmand, T., Tabatabaei, S., Ivanov, A., "Crosstalk bounded uncorrelated jitter (BUJ) for high-speed interconnects", IEEE Trans. Instrum. Meas. (USA), vol. 54, pp. 1800-10, oct. Abstract Tagged XML BibTex
Wang, Baosheng, Kuo, A., Farahmand, T., Ivanov, A., Cho, Y.B., Tabatabaei, S., "A realistic timing test model and its applications in high-speed interconnect devices", J. Electron. Test., Theory Appl. (Netherlands), vol. 21, pp. 621-30, dec. Abstract Tagged XML BibTex
2004
Ou, N., Farahmand, T., Kuo, A., Tabatabaei, S., Ivanov, A., "Jitter models for the design and test of Gbps-speed serial interconnects", IEEE Des. Test Comput. (USA), vol. 21, pp. 302-13, jul. Abstract Tagged XML BibTex
Kuo, A., Farahmand, T., Ou, N., Tabatabaei, S., Ivanov, A., "Jitter models and measurement methods for high-speed serial interconnects", Proceedings. International Test Conference 2004 (IEEE Cat. No.04CH37586), Charlotte, NC, USA, IEEE, pp. 1295-302, 2004  . Abstract Tagged XML BibTex