"Catastrophic short and open fault detection in bipolar CML circuits: a case study", J. Electron. Test., Theory Appl. (Netherlands), vol. 16, pp. 631-4, dec.
"Non-intrusive testing of high-speed CML circuits", Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259), Singapore, IEEE Comput. Soc, pp. 172-8, 1998 .