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Ivanov, A., Devdas, V., "Catastrophic short and open fault detection in bipolar CML circuits: a case study", J. Electron. Test., Theory Appl. (Netherlands), vol. 16, pp. 631-4, dec. Abstract Tagged XML BibTex
Devdas, V., Ivanov, A., "Non-intrusive testing of high-speed CML circuits", Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259), Singapore, IEEE Comput. Soc, pp. 172-8, 1998  . Abstract Tagged XML BibTex