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2004
Wang, Baosheng, Yang, J., Cicalo, J., Ivanov, A., Zorian, Y., "Reducing embedded SRAM test time under redundancy constraints", Proceedings. 22nd IEEE VLSI Test Symposium, Napa Valley, CA, USA, IEEE Comput. Soc, pp. 237-42, 2004  . Abstract Tagged XML BibTex